发明名称 BEAM STOP FOR AN ION IMPLANTER
摘要 A beam stop apparatus for an ion implanter is provided to shape and steer an ion beam in response to signals supplied from an electric charge collector and an electric charge collection baffle. A beam stop apparatus(100) for an ion implanter includes an electric charge collector having a segmented surface for receiving an ion beam. The surface is divided into at least two segments. One segment is extended around the other segments. Each of the two segments is operable to supply one or more signals for indicating electric charges collected by the segment in an incident state of the ion beam. The surface is divided into at least two concentrically arranged segments. The concentrically arranged segments include annular segments. The annular segments are extended around central circular segments.
申请公布号 KR20080008269(A) 申请公布日期 2008.01.23
申请号 KR20070071590 申请日期 2007.07.18
申请人 APPLIED MATERIALS INC. 发明人 COLLART ERIK;GOLDBERG RICHARD DAVID;BURGESS CHRISTOPHER
分类号 H01J37/30;H01J37/244;H01J37/304 主分类号 H01J37/30
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