发明名称 SRAM cell
摘要 A method for forming a resistor of high value in a semiconductor substrate including forming a stack of a first insulating layer, a first conductive layer, a second insulating layer, and a third insulating layer, the third insulating layer being selectively etchable with respect to the second insulating layer; etching the stack, to expose the substrate and keep the stack in the form of a line; forming insulating spacers on the lateral walls of the line; performing an epitaxial growth of a single-crystal semiconductor on the substrate, on either side of the line; selectively removing the third insulating layer to partially expose the second insulating layer at a predetermined location; and depositing and etching a conductive material to fill the cavity formed by the previous removal of the third insulating layer.
申请公布号 US7320923(B2) 申请公布日期 2008.01.22
申请号 US20050305553 申请日期 2005.12.16
申请人 STMICROELECTRONICS CROLLES 2 SAS 发明人 BOROT BERTRAND;CORONEL PHILIPPE
分类号 H01L21/331 主分类号 H01L21/331
代理机构 代理人
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