发明名称 Graphic contour extracting method, pattern inspecting method, program and pattern inspecting system
摘要 A graphic contour extracting method includes: acquiring an image of a graphic form to be inspected; defining an inspection region for the image of the graphic form to be inspected by an inspection graphic form including at least one of a circle, an ellipse, a rectangle, a first rectangular graphic form, a second rectangular graphic form and a closed curved graphic form, at least one end of the first rectangular graphic form being replaced with any one of a semi-circle, a semi-ellipse and a parabola, at least one of four corners of the second rectangular graphic form being replaced with a ¼ circle or a ¼ ellipse, the closed curved graphic form being expressed by the following expression: <maths id="MATH-US-00001" num="00001"> <MATH OVERFLOW="SCROLL"> <MROW> <MROW> <MROW> <MFRAC> <MSUP> <MROW> <MO>(</MO> <MROW> <MI>x</MI> <MO>-</MO> <MSUB> <MI>x</MI> <MN>0</MN> </MSUB> </MROW> <MO>)</MO> </MROW> <MN>4</MN> </MSUP> <MSUP> <MI>a</MI> <MN>4</MN> </MSUP> </MFRAC> <MO>+</MO> <MFRAC> <MSUP> <MROW> <MO>(</MO> <MROW> <MI>y</MI> <MO>-</MO> <MSUB> <MI>y</MI> <MN>0</MN> </MSUB> </MROW> <MO>)</MO> </MROW> <MN>4</MN> </MSUP> <MSUP> <MI>b</MI> <MN>4</MN> </MSUP> </MFRAC> </MROW> <MO>=</MO> <MN>1</MN> </MROW> <MO>,</MO> </MROW> </MATH> </MATHS> and the inspection graphic form having an edge searching direction previously defined for at least one component thereof; and searching an edge of the graphic form to be inspected on the basis of the inspection graphic form to acquire contour information of the graphic form to be inspected.
申请公布号 US7321680(B2) 申请公布日期 2008.01.22
申请号 US20040807188 申请日期 2004.03.24
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 IKEDA TAKAHIRO;MIYANO YUMIKO
分类号 G06K9/36;H01L21/66;G01B5/02;G01B11/02;G01B11/14;G01B13/02;G01B21/02;G06F15/00;G06F19/00;G06K9/48;G06K9/62;G06T1/00;G06T3/00;G06T7/60 主分类号 G06K9/36
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