| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor management device which can perform burn-in simplification efficiently in final test process. SOLUTION: In the semiconductor management device, a number of sheets of wafer judging section 21 judges pass/rejection in wafer test by the number of sheets of wafer. A lot divider 22 divides the wafers into a passed lot and an rejected lot depending on the judgment result from the number of sheets of wafer judging section 21. A flag adder 23 adds different flags to the passed lot and the rejected lot divided at the lot dividing section 22, thus adding information indicating whether burn-in inspection is performed for that lot or not. Consequently, the wafers for which burn-in inspection is performed in the final test process can be collected, and burn-in simplification can be performed efficiently. COPYRIGHT: (C)2008,JPO&INPIT
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