发明名称 Method of heating semiconductor wafer to improve wafer flatness
摘要 A method of heating-treating a semiconductor wafer is provided. In one embodiment, a first layer is formed over a first side of a substrate. A second layer is formed over the first layer and over a second side of the substrate and the wafer is then flash annealed. In another embodiment, a first layer is formed over a first side of a substrate and over a second side of the substrate. A second layer is formed over the first layers and the wafer is then flash annealed.
申请公布号 US2008014763(A1) 申请公布日期 2008.01.17
申请号 US20060486098 申请日期 2006.07.14
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 LU HSIAO-TZU;LIN BURN-JENG;LIN CHIN-HSIANG;CHEN KUEI-SHUN;GAU TSAI-SHENG
分类号 H01L21/00 主分类号 H01L21/00
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