发明名称 APPARATUS AND METHOD FOR TREATING SUBSTRATE
摘要 A substrate treating apparatus of a single substrate type and a substrate treating method using the same are provided to prevent exposure of a treating surface of a substrate to external environment and to suppress generation of watermarks on the surface of a wafer. A housing(110) provides a space for cleaning and drying a substrate. A supporting member(120) is formed to support and rotate the substrate in the inside of the housing. A nozzle part(310) supplies chemicals to a treating surface of the substrate which is supported by the supporting member. A protection cover includes a plate having a bottom surface facing the treating surface and injection holes for injecting a cleaning fluid to the treating surface. A plurality of collection barrels are installed between the housing and the supporting member in order to collect one of the chemicals and the cleaning fluid. A control unit(400) controls the height of the protection cover in order to form a liquid film for blocking the external air on the treating surface of the substrate.
申请公布号 KR100794588(B1) 申请公布日期 2008.01.17
申请号 KR20060075691 申请日期 2006.08.10
申请人 SEMES CO., LTD. 发明人 LIM, JUNG SOO
分类号 H01L21/304 主分类号 H01L21/304
代理机构 代理人
主权项
地址