摘要 |
A high-speed signal testing system that includes a digital circuitry for providing a pattern tester with oscilloscope functionality at minimal implem entation cost. The digital circuitry includes a time -base generator that pr ovides a high-speed repeating time-base signal. The time-base signal, in con junction with a sub-sampler and an accumulation memory, allows the system to zoom in on, and analyze portions of, one or more bits of interest in a repe ating pattern present on the signal under test. Such portions of interest in clude rising and falling edges and constant high and low bit values.
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