| 摘要 |
PROBLEM TO BE SOLVED: To provide an X-ray spectrometric method for easily determining an absolute wavelength and performing spectrometric measurement of high precision by a simple constitution, and to provide an X-ray spectroscope. SOLUTION: In the X-ray spectrometric method performed using a spectroscopic channel cut crystal (20) having two opposed cut surfaces formed thereto and known in its lattice constant, X rays are diffracted in respective arrangements wherein the spectroscopic channel cut crystal (20) becomes (-, +) and (+, -) and the absolute wavelength of X rays is determined from the difference between the angles of rotation of the crystal in the respective arrangements. By this constitution, alignment becomes simple and, if even the channel cut crystal suitable for measurement is prepared, X-ray spectrometric measurement can be easily performed with high precision. COPYRIGHT: (C)2008,JPO&INPIT |
