| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit capable of shortening a function verification time, and to provide a method for verifying the semiconductor integrated circuit. SOLUTION: This semiconductor integrated circuit is provided with: functional blocks (A to C) 1, 2 and 3; a bus 4 connected to each functional block; and a memory 5 connected to the bus. After the individual verification of the functional block A is completed, and the functional block A is integrated into the semiconductor integrated circuit, and the data are output from the functional block A, the output signal of the functional block A is written in the memory, and when the individual verification of a functional block B is completed, and the functional block B is integrated into the semiconductor integrated circuit, the data written in the memory are read to the functional block B. COPYRIGHT: (C)2008,JPO&INPIT
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