发明名称 ILLUMINATION SYSTEM FOR MICROLITHOGRAPHY
摘要 An illumination system for a microlithography projection exposure apparatus for illuminating an illumination field with the light from an assigned light source includes a pupil shaping unit for receiving light from the assigned light source and for generating a predeterminable basic light distribution in a pupil plane of the illumination system, and a transmission filter assigned to the pupil shaping unit and having at least one array of individually drivable individual elements for the spatially resolving transmission filtering of the light impinging on the transmission filter in or in proximity to a pupil plane of the illumination system. The transmission filter generates a predetermined correction of the basic light distribution. An illumination system of this type can generate a multiplicity of location-dependent intensity distributions in a pupil plane of the illumination system, and ensure a high transmittance.
申请公布号 US2008013066(A1) 申请公布日期 2008.01.17
申请号 US20070860193 申请日期 2007.09.24
申请人 CARL ZEISS SMT AG 发明人 BROTSACK MARKUS
分类号 G03B27/72 主分类号 G03B27/72
代理机构 代理人
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