| 摘要 |
PROBLEM TO BE SOLVED: To realize an integrated circuit which reduces the time for DC performance test, tests even with a tester having no testing circuit necessary for DC performance test. SOLUTION: The integration circuit comprises: an output circuit 22 provided with two transistors Tr1, Tr2 serially connected with different polarities; and a control circuit 31 for controlling the either transistor Tr2 of the output circuit for making operate as a current source for measuring the output performance while making conduct the other transistor Tr1, at the time of measuring the output performance of the output circuit. COPYRIGHT: (C)2008,JPO&INPIT
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