| 摘要 |
A thin film calorimeter test station can be coupled to a controller in a thin film calorimeter. The thin film calorimeter can comprise a base substrate, a heat flux sensing device mounted on the base substrate, a mask having a hole with a predetermined area positionable above the heat flux sensing device, and a thickness control device for establishing a repeatable precise thickness layer of UV curable sample test material between the mask and the heat flux sensing device. The thin film calorimeter is used to determine several factors of UV curability. A double test platform test station can be provided so that tests at an active test platform and a dummy platform can be performed simultaneously using the same UV light source. Also, the base substrate can be thermally conductive and be mounted on a thermoelectric heater and cooler for controlling the temperature of the test. Furthermore, the base substrate can be mounted on a digital electronic scale whereby a quantity of UV curable sample test material can be weighed, exposed to UV light for a curing test and then a "factor of UV curability" in heat per weight, e.g. joules per gram, can be determined. |
