| 摘要 |
An apparatus for controlling a semiconductor device tester is provided to secure quick and reliable control operations by using a hub serial-communicating with a semiconductor device tester, to perform interactive communications at high speed, and to reduce the number of bus signal lines. An apparatus for controlling a semiconductor device tester testing plural semiconductor devices at the same time by installing plural PGBs(Pattern Generation Board,2000,3000) comprising plural programmable logic devices comprises a host controller(100) generating a control signal controlling the programmable logic devices; a tester control hub(150) connected to the host controller to receive the control signal; and PGB control hubs(200,300) receiving the control signal distributed from the tester control hub, through a serial control bus and transmitting the control signal to the programmable logic device of the PGB. |
