| 摘要 |
A semiconductor device tester configuring apparatus is provided to program plural programmable logic devices remotely or locally and to use plural program sets with switching the program sets by remotely programming the programmable logic devices. An apparatus for configuring a semiconductor device tester testing plural semiconductor devices at the same time by installing plural PGBs(Pattern Generation Board,2000,3000) comprising plural programmable logic devices(190) comprises PGB control hubs(200,300) receiving a first program for configuring the programmable logic device and transmitting the first program to the programmable logic device through a parallel configuration bus; a tester control hub(150) transmitting a second program for configuring the PGB control hub, to the PGB control hub through a serial configuration bus; and a host controller(100) connected to the tester control hub to store the first and second programs and a third program configuring the tester control hub. |
