发明名称 |
A METHOD OF BRIGHT-FIELD IMAGING USING X-RAYS |
摘要 |
<p>Provided is a method of bright-field imaging using x-rays in a sample to reveal lattice defects as well as structural inhomogeneities, the method comprising:(a)disposing a sample on a holder in the Laue transmission geometry and setting the sample to a single reflection in the Bragg diffraction;(b)projecting a beam of monochromatic x-rays on the sample;and(c)obtaining transmitted radiographic images and reversed diffracted images of the projected beam of monochromatic x-rays by the sample, respectively.</p> |
申请公布号 |
WO2008007817(A1) |
申请公布日期 |
2008.01.17 |
申请号 |
WO2006KR02735 |
申请日期 |
2006.07.12 |
申请人 |
POSTECH FOUNDATION;POSTECH ACADEMY-INDUSTRY FOUNDATION;JE, JUNG HO;YI, JAE MOK |
发明人 |
JE, JUNG HO;YI, JAE MOK |
分类号 |
G01N23/18;G01N23/083;G01N23/20 |
主分类号 |
G01N23/18 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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