发明名称 A METHOD OF BRIGHT-FIELD IMAGING USING X-RAYS
摘要 <p>Provided is a method of bright-field imaging using x-rays in a sample to reveal lattice defects as well as structural inhomogeneities, the method comprising:(a)disposing a sample on a holder in the Laue transmission geometry and setting the sample to a single reflection in the Bragg diffraction;(b)projecting a beam of monochromatic x-rays on the sample;and(c)obtaining transmitted radiographic images and reversed diffracted images of the projected beam of monochromatic x-rays by the sample, respectively.</p>
申请公布号 WO2008007817(A1) 申请公布日期 2008.01.17
申请号 WO2006KR02735 申请日期 2006.07.12
申请人 POSTECH FOUNDATION;POSTECH ACADEMY-INDUSTRY FOUNDATION;JE, JUNG HO;YI, JAE MOK 发明人 JE, JUNG HO;YI, JAE MOK
分类号 G01N23/18;G01N23/083;G01N23/20 主分类号 G01N23/18
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