| 摘要 |
PROBLEM TO BE SOLVED: To provide a method for measuring respective ratios in terms of film thicknesses, non-destructively and with high measurement accuracy, by using the peak area of an infrared spectral diffraction absorbed waveform, as to a lubricating film of a magnetic recording medium with its lubrication layer comprising a mixed lubricating film of a plurality of lubricants. SOLUTION: This film thickness measuring method is used for the lubrication layer of the magnetic recording medium, comprising a foundation layer, a magnetic layer, a protective layer, and the lubrication layer on a nonmagnetic substrate, and the lubrication layer being made up of a mixture of a compound with CF<SB>3</SB>structures in its molecules and a perfluoro polyether lubricant without CF<SB>3</SB>structures in its molecules. This method is characterized in that the lubrication layer is measured by Fourier transform infrared spectroscopy and the quantities of respective constituents of the lubrication layer are calculated in terms of film thicknesses by quantifying the area of a domain surrounded by a base line of respective peaks and the absorbed waveform without performing waveform-separation on peaks of 1333 cm<SP>-1</SP>and 1280 cm<SP>-1</SP>of an obtained infrared absorption spectrum. COPYRIGHT: (C)2008,JPO&INPIT
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