| 摘要 |
PROBLEM TO BE SOLVED: To provide an inspection apparatus by which the inspection of a display can be exactly carried out in a short period of time without shifting one's eyes. SOLUTION: The inspection apparatus is equipped with an inspection image display RAM 32, a functional inspection result display RAM 33, a defect sample image supply circuit 34, the display position control section 35 of the defect sample image, and a controller 31 for these. Test pattern image data for each inspection output from the inspection image display RAM 32 and the inspection result data output from the function inspection result display RAM 33 are combined in a functional inspection, or the test pattern image data for each inspection output from the inspection image display RAM 32 and the defect sample image data selectively output from the defect sample image supply circuit 34 are combined in a display visual inspection, by a composite display section 36 on the basis of the display position data of the display position control section 35 and are displayed on a liquid crystal display panel 1. COPYRIGHT: (C)2008,JPO&INPIT
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