| 摘要 |
PROBLEM TO BE SOLVED: To provide a circuit deterioration testing device and a circuit deterioration test method causing few failures of a driving source even when a high-temperature ion-migration resistance test is performed. SOLUTION: This circuit deterioration testing device 1 is equipped with a bending movement application mechanism 10 for bending repeatedly a distributing board 60 having flexibility, the driving source 31 for driving the bending movement application mechanism 10, a voltage application means 40 for applying a voltage between insulated circuits on the distributing board 60, an insulation resistance measuring means 50 for measuring an electric resistance between the insulated circuits on the distributing board 60, and a thermostat 35 storing the bending movement application mechanism 10. The driving source 31 is arranged outside the thermostat 35. COPYRIGHT: (C)2008,JPO&INPIT
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