| 摘要 |
The invention relates to a calibrating device for adapting a measuring device for measuring the thickness of thin layers on an object to be measured, comprising a calibrating surface ( 12 ) having a flat upper side and a flat underside, which are provided at a distance with a predetermined thickness, characterized in that the calibrating surface ( 12 ) is arranged separate from at least one edge area ( 18 ) and the calibrating surface ( 12 ) is connected to the at least one edge area ( 18 ) via at least one transition area ( 14 ).
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