发明名称 Vertical gate semiconductor device and method for manufacturing the same
摘要 A gate electrode is buried in a trench passing through a second conductivity type first body region formed on a first conductivity type drain region so as to form a recessed portion at the upper part of the trench. An insulating film is formed on the gate electrode so as to occupy the recessed portion partway. A first conductivity type source region is formed in at least a region of the upper part of the first body region which serves as at least the wall part of the trench. A second conductivity type second body region is formed in the other region of the upper part thereof so as to be adjacent to the source region in the direction that the trench extends. A second conductivity type third body region is formed in the respective upper parts of the source region and the second body region.
申请公布号 US2008012069(A1) 申请公布日期 2008.01.17
申请号 US20070819784 申请日期 2007.06.29
申请人 MIZOKUCHI SHUJI 发明人 MIZOKUCHI SHUJI
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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