发明名称 Method for adjusting the threshold voltage of a memory cell
摘要 <p>In a method for adjusting a threshold voltage of a memory cell, energy is applied into a film comprised of a material capable of changing threshold voltage. By way of example, the film may be comprised of a chalcogenide material. The energy may be applied in the form of an electrical pulse (voltage pulse or current pulse), a pulse of light (a laser pulse), a pulse of heat, or microwave energy. The energy pulses may have a predetermined magnitude, may have a predetermined profile, and may be applied for a predetermined duration to change the threshold voltage. A method for adjusting a threshold voltage of a chalcogenide material also is described. In this method, energy is applied into a chalcogenide material.</p>
申请公布号 EP1489670(B1) 申请公布日期 2008.01.16
申请号 EP20030026608 申请日期 2003.11.19
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 CHEN, YI-CHOU;LU, CHIH-YUAN
分类号 H01L27/105;H01L45/00 主分类号 H01L27/105
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