发明名称 METHOD FOR DEFECT MANAGEMENT USING CHANGE OF DEFECT SCAN FACTOR AND A HARD DISK DRIVE USING THE METHOD
摘要 A method for defect management using change of a defect scan factor and a hard disc drive using the method are provided to control defects by finding all defects up to a design permitted limit of the hard disc drive. A method for defect management using change of a defect scan factor includes a step of performing a defect scanning operation and detecting whether the number of defects exceeds a design permitted limit(S310,S320); a step of changing a value of the defect scan factor as the defect number is in the design permitted limit(S350); a step of performing the defect scanning operation based on the value-changed defect scan factor(S360,S370); and a step of changing the value of the defect scan factor until the number of the defects reaches the design permitted limit(S380). A hard disc drive using the method includes a disc, a read/write head, and a control unit. The read/write head reads and writes data from/to the disc. The control unit performs the defect scanning operation by changing the defect scan factor until the number of the defects reaches the design permitted limit.
申请公布号 KR20080006361(A) 申请公布日期 2008.01.16
申请号 KR20060065472 申请日期 2006.07.12
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YUN, JONG YUN
分类号 G11B20/18;G11B20/10 主分类号 G11B20/18
代理机构 代理人
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