Probe card contact block and apparatus for electrical connection

摘要

A contactor block for a probe card used in testing integrated circuits is characterized by including a beam-like holder (34) having an underside and a retreat portion formed on a side following the underside; and a contact sheet (40) provided with a plurality of contactors (64) at intervals in the longitudinal direction of the holder and disposed in the outer periphery of the holder so as to be located on the underside of the holder (34).