发明名称 PREDICTIVE TIMING CALIBRATION FOR MEMORY DEVICES
摘要 The pressed invention provides a unique way of using a 2 N bit synchronization pattern to obtain a faster and more reliable calibration of multiple data paths in a memory system. If the 2 N bit synchronization pattern is generated with a known clock phase relationship, then the data-to-clock phase alignment can be determined using simple decode logic to predict the next m-bits from a just-detected m-bits. If the succeeding m-bit pattern does not match the predicted pattern, then the current data-to-clock alignment fails for a particular delay value adjustment in the data path undergoing alignment, and the delay in that data path is adjusted to a new value. The invention also ensures that data alignment will occur to a desired edge of the clock signal, e.g., a positive going edge, by forcing a failure of all predicted m-bit patterns which are associated with an undesired edge, e.g., a negative going edge, of the clock signal.
申请公布号 EP1282677(B1) 申请公布日期 2008.01.16
申请号 EP20010933122 申请日期 2001.05.07
申请人 MICRON TECHNOLOGY, INC. 发明人 KEETH, BRENT;JOHNSON, BRIAN
分类号 G11C7/10;G11C11/407;G11C11/4076 主分类号 G11C7/10
代理机构 代理人
主权项
地址
您可能感兴趣的专利