发明名称 Ramp gate erase for dual bit flash memory
摘要 A method of erasing a block of flash memory cells by applying a ramped gate erase voltage to the block of memory cells. When an erase verify of the block of memory cells indicates that erasure has not been successfully completed another erase voltage with a greater absolute value than the initial erase voltage can be applied to the block of memory cells until erasure is complete.
申请公布号 US7319615(B1) 申请公布日期 2008.01.15
申请号 US20060497597 申请日期 2006.08.02
申请人 SPANSION LLC 发明人 PARK SHEUNG-HEE;JONES GWYN;LEUNG WING;RUNNION EDWARD FRANKLIN;KWAN MING-SANG;WANG XUGUANG;HE YI
分类号 G11C16/06 主分类号 G11C16/06
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