发明名称 COMPOSITION FOR COPPER WIRING POLISHING AND METHOD OF POLISHING SURFACE OF SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 A technology for realizing a high-precision surface planarization in the use of copper as a wiring metal. Use is made of a polishing composition comprising water; a peroxide oxidizer; a surface protective agent for copper; at least one first chelating agent selected from the group consisting of tartaric acid, malonic acid, malic acid, citric acid, maleic acid, oxalic acid and fumaric acid; and at least one second chelating agent selected from the group consisting of triethylenetetramine, ethylenediaminediacetic acid, ethylenediaminetetraacetic acid, tetraethylenepentamine, glycol-ether-diaminetetraacetic acid, trasn-1,2-cyclohexanediaminetetraacetic acid, o-phenanthroline and derivatives thereof.
申请公布号 KR20080005354(A) 申请公布日期 2008.01.11
申请号 KR20077019259 申请日期 2007.08.23
申请人 ASAHI GLASS COMPANY LTD.;AGC SEIMI CHEMICAL CO., LTD. 发明人 TSUGITA KATSUYUKI;KAMIYA HIROYUKI
分类号 C09K3/14;H01L21/304 主分类号 C09K3/14
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