发明名称 |
COMPOUND, POLYMER COMPOUND, POSITIVE RESIST COMPOSITION, AND RESIST PATTERN FORMATION METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a novel compound, a polymer compound, a positive resist composition containing the polymer compound, and a resist pattern formation method using the positive resist composition. <P>SOLUTION: The compound is represented by formula (I). The polymer compound comprises structural units (a1) represented by formula (II). In formulae (I) and (II), R<SP>1</SP>is a hydrogen atom or a methyl group; R<SP>2</SP>and R<SP>3</SP>are each independently a hydrogen atom or a 1-5C alkyl group; n is an integer of 0-3; and Z is a 4-12C alicyclic group having a fluorine atom and/or a fluoroalkyl group as substituents. <P>COPYRIGHT: (C)2008,JPO&INPIT |
申请公布号 |
JP2008001767(A) |
申请公布日期 |
2008.01.10 |
申请号 |
JP20060171174 |
申请日期 |
2006.06.21 |
申请人 |
TOKYO OHKA KOGYO CO LTD |
发明人 |
OGATA TOSHIYUKI;FURUYA SANAE;KINOSHITA YOHEI;IRIE MAKIKO |
分类号 |
C08F20/28;C07C69/54;G03F7/039;H01L21/027 |
主分类号 |
C08F20/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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