| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an integrated circuit allowing scan tests, while preventing security data stored in an inside of an LSI from being read out or rewritten in unauthorized manner, by constitution of a reduced circuit scale. <P>SOLUTION: This semiconductor integrated circuit is provided with a test mode determining circuit for determining the normal operation mode and test mode, by using a scan enable signal used for the scan test, when inputting a clock from a reset condition to start an operation, and for holding a determination result until rest. The semiconductor integrated circuit is further provided with a scan enable masking circuit for prohibiting transfer of the scan enable signal to an internal scan circuit, in response to a determination result signal. The semiconductor integrated circuit is provided with an access control means for prohibiting access to an internal storage means, in response to the determination result signal from the test mode determining circuit. The scan enable signal is used in common with a usual operation input signal. <P>COPYRIGHT: (C)2008,JPO&INPIT |
