发明名称 SLURRY FOR USE IN Cu FILM CMP, POLISHING METHOD, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide CMP slurry capable of polishing a Cu film at a practical speed while inhibiting dishing or corrosion without leaving Cu residuals. <P>SOLUTION: The CMP slurry contains water, persulfuric acid or its salt, basic amino acid blended by &ge;0.05 wt.% and &le;0.5 wt.%, a water insoluble complex formation agent for forming a water insoluble complex of metal, a surfactant, and colloidal silica with a primary particle diameter of &ge;5 nm and &le;50 nm. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008004621(A) 申请公布日期 2008.01.10
申请号 JP20060170224 申请日期 2006.06.20
申请人 TOSHIBA CORP 发明人 MINAMI FUKUGAKU;YANO HIROYUKI;FUKUSHIMA MASARU
分类号 H01L21/304;B24B37/00;B82Y10/00;B82Y99/00;C09K3/14 主分类号 H01L21/304
代理机构 代理人
主权项
地址