发明名称 |
PARTIAL GOOD INTEGRATED CIRCUIT AND METHOD OF TESTING SAME |
摘要 |
An integrated circuit and method of testing and repairing the integrated circuit. The integrated circuit includes: a multiplicity of macro-circuits having the same function; a fuse bank, the state of the fuses storing test data indicating at least which macro-circuits failed a test; and means for preventing utilization of failing macro-circuits during operation of the integrated circuit and a method generating a partial good integrated circuit, the method including: providing an integrated circuit have a multiplicity of macro-circuits arranged in one or more groups, each macro-circuit having the same function and a fuse bank containing fuses; testing each macro-circuit prior to a fuse programming operation; programming the fuses in the fuse bank in order to store data indicating at least which macro-circuits failed the testing step; and preventing utilization of each failing macro-circuit during operation of the integrated based on the data stored in the fuse bank.
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申请公布号 |
US2008010571(A1) |
申请公布日期 |
2008.01.10 |
申请号 |
US20070859834 |
申请日期 |
2007.09.24 |
申请人 |
FARNSWORTH LEONARD O III;FELSKE MICHAEL Z;GILLIS PAMELA S;LYNCH BENJAMIN P;OUELLETTE MICHAEL R;ST PIERRE THOMAS;WILDER TAD J;BARNHART CARL F |
发明人 |
FARNSWORTH LEONARD O.III;FELSKE MICHAEL Z.;GILLIS PAMELA S.;LYNCH BENJAMIN P.;OUELLETTE MICHAEL R.;ST. PIERRE THOMAS;WILDER TAD J.;BARNHART CARL F. |
分类号 |
G06F11/25;G01R31/3185 |
主分类号 |
G06F11/25 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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