发明名称 METHOD AND DEVICE FOR ANALYZING STATE TRANSITION IN PSEUDO RANDOM NUMBER GENERATING MECHANISM, AND PERIOD LENGTH MEASURING DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To solve a conventional problem that an increased scale of a pseudo random number generating mechanism leads to an increased analysis time and difficult drawing of a state transition diagram, while, conventionally, the state transition is manually analyzed, the state transition diagram is manually drawn, and the period length is measured by counting the number of states constituting a loop length in the formed state transition diagram. <P>SOLUTION: State variables are successively assigned to states corresponding to pseudo random numbers generated by a pseudo random number generation part 22, a relevancy each between the states with the state variables assigned thereto is analyzed in a state transition analysis part 23, and automatic drawing is performed in an input and output part 21 based on state transition diagram display information resulted from the analysis. The time of forming the state transition diagram can be shortened while saving the labor. Period length can be also measured in the state transition part 23. The period length measuring device comprising the pseudo random number generation part 22 and a period length measurement part of the state transition analysis part 23 with FPGAs (field programmable gate arrays), can measure the period length at high speed. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008003937(A) 申请公布日期 2008.01.10
申请号 JP20060174216 申请日期 2006.06.23
申请人 TECHNICAL RESEARCH & DEVELOPMENT INSTITUTE MINISTRY OF DEFENCE 发明人 ARAI KOJI;YAMAUCHI TAKESHI
分类号 G06F7/58 主分类号 G06F7/58
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