发明名称 METHOD OF MAKING A DUAL STRAINED CHANNEL SEMICONDUCTOR DEVICE
摘要 According to the embodiments to the present disclosure, the process of making a dual strained channel semiconductor device (10) includes integrating strained Si (16) and compressed SiGe (28) with trench isolation (24) for achieving a simultaneous NMOS and PMOS performance enhancement. As described herein, the integration of NMOS and PMOS can be implemented in several ways to achieve NMOS and PMOS channels compatible with shallow trench isolation.
申请公布号 WO2006107419(A3) 申请公布日期 2008.01.10
申请号 WO2006US05471 申请日期 2006.02.16
申请人 FREESCALE SEMICONDUCTOR, INC.;SADAKA, MARIAM G.;BARR, ALEXANDER L.;JOVANOVIC, DEJAN;NGUYEN, BICH-YEN;THEAN, VOON-YEW;THOMAS, SHAWN G.;WHITE, TED R. 发明人 SADAKA, MARIAM G.;BARR, ALEXANDER L.;JOVANOVIC, DEJAN;NGUYEN, BICH-YEN;THEAN, VOON-YEW;THOMAS, SHAWN G.;WHITE, TED R.
分类号 H01L21/8238 主分类号 H01L21/8238
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