| 摘要 |
A method for testing electric elements includes applying a first beam of particles to a first location of an electric element, to liberate electrons from the first location, and applying a second beam of particles to a second location of an electric element, with a temporal shift (Deltat) different from zero in relation to the application of the first beam of particles, to liberate electrons from the second location. The temporal shift is on the order of magnitude of a propagation time of electrons between the first and the second location. Electrons liberated under the effect of the first and second beams of particles are collected, and at least one quantity of electric charges corresponding to the collected electrons liberated under the effect of the second beam of particles is measured and quantitatively or qualitatively deducing therefrom an electric feature of the electric element.
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