发明名称 ANALYSIS METHOD AND ANALYSIS DEVICE OF ELEMENT IN SAMPLE MELTED AND TREATED IN INERT GAS ATMOSPHERE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a precise element analysis method and a precise element analyzer capable of capturing a measurement target for measurement selectively from a coexisting gas constituent without using any columns and securing reliability to a measurement value in the analysis of hydrogen and an element containing hydrogen by the melting of inert gas. <P>SOLUTION: One or several of a hydrogen treatment section 5, a carbon treatment section 6, a carbon dioxide treatment section 7, and a moisture treatment section 8 can be arranged. The hydrogen treatment section 5 has heating and cooling means while accommodating a hydrogen storage alloy in a sample gas treatment channel (a) by providing the sample gas secondary treatment channel (a) for performing a prescribed secondary treatment to the sample gas. The carbon treatment section 6 arranges an introduction section of specific carrier gas at the downstream side of the hydrogen treatment section 5 and stores an oxidizer containing oxygen. The carbon dioxide treatment section 7 removes carbon dioxide. The moisture treatment section 8 removes moisture. <P>COPYRIGHT: (C)2008,JPO&INPIT</p>
申请公布号 JP2008003050(A) 申请公布日期 2008.01.10
申请号 JP20060175476 申请日期 2006.06.26
申请人 HORIBA LTD 发明人 UCHIHARA HIROSHI;SAKAKURA SEIJI;NOGUCHI SHINTARO
分类号 G01N25/18;G01N21/35 主分类号 G01N25/18
代理机构 代理人
主权项
地址