发明名称 |
NON-VOLATILE MEMORY DEVICE HAVING FOUR STORAGE NODE FILMS AND METHOD OF OPERATING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a non-volatile memory device having four storage node films, and to provide a method of operating the same. SOLUTION: The nonvolatile memory device includes a first fin 105a and a second fin 105b. A buried insulating layer 115 is arranged between the first fin 105a and the second fin 105b. A control gate electrode 140 covers side faces of the first and second fins opposite to the buried insulation layer. A gate insulation film 130 is arranged between the first and second fins and the control gate electrode. A first source region and a first drain region are formed in a first fin portion 105a and separated from the control gate electrode, respectively. A second source region and a second drain region that are formed in a second fin portion 105b and separated from the control gate electrode, respectively. A first storage node film 160a1 and a second storage node film 160a2 are formed on a side face of the first fin 105a with the control gate electrode inbetween, and a third storage node film 160b1 and a fourth storage node film 160b2 are formed on a side face of the second fin 105b with the control gate electrode inbetween. COPYRIGHT: (C)2008,JPO&INPIT
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申请公布号 |
JP2008004925(A) |
申请公布日期 |
2008.01.10 |
申请号 |
JP20070125945 |
申请日期 |
2007.05.10 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
PARK YOON-DONG;KIM SUK-PIL;HYUN JAE-WOONG |
分类号 |
H01L21/8247;H01L27/115;H01L29/788;H01L29/792 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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