| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device that can load various chips to be driven with a high voltage higher than supply voltage, and can achieve testing of a plurality of chips of different voltages within a short period of time. SOLUTION: The semiconductor device includes: a plurality of semiconductor chips 20 each having an internal circuit 21, and an internal voltage generating circuit 22 for generating an internal voltage required for driving the internal circuit 21; a voltage boosting circuit 14 for boosting up the supply voltage V1; a voltage falling down circuit 15 for falling down the supply voltage V1 electrically connected to a plurality of semiconductor chips 20; and a power supply chip 10 having a power supply voltage generating circuit 11 for generating a plurality of power supply voltages for supplying the same power supply voltages to a plurality of semiconductor chips 20 from the supply voltage V1, and a control circuit 12 for controlling the power supply voltage generating circuit 11. COPYRIGHT: (C)2008,JPO&INPIT
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