发明名称 LASER SCANNING MICROSCOPE
摘要 Provided is a laser scanning microscope having improved degrees of freedom for observation, while keeping the configuration simple. A laser scanning microscope (100) is provided with a light source section (1); a spectroscopic means (9), which guides light from the light source section (1) to a surface (16) to be observed and guides the light from the surface (16) to a detector; optical path switching means (10, 13) for switching an optical path between the spectroscopic means (9) and the surface (16) to and from a plurality of optical paths (R1, R2) having different paths; and a plurality of light deflecting means (11, 12) arranged on the optical paths, respectively.
申请公布号 WO2008004336(A1) 申请公布日期 2008.01.10
申请号 WO2007JP00657 申请日期 2007.06.20
申请人 NIKON CORPORATION;OKUGAWA, HISASHI 发明人 OKUGAWA, HISASHI
分类号 G02B21/00;G01N21/64;G02B26/08 主分类号 G02B21/00
代理机构 代理人
主权项
地址