发明名称 |
POLISHING PAD AND ITS MANUFACTURING METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a polishing pad which improves flattening performance without lowering a polishing speed and wear resistance, a manufacturing method for the polishing pad and a manufacturing method for a semiconductor device using the polishing pad. <P>SOLUTION: The polishing pad has a polishing layer 2 formed of a polyurethane foaming body in the concave section of a concave highly-elastic layer 3 in a firmly-stuck state. The highly-elastic layer is formed of a non-foaming body, and the elastic modulus of the highly-elastic layer is greater than the elastic modulus of the polishing layer by 10 MPa or larger. <P>COPYRIGHT: (C)2008,JPO&INPIT |
申请公布号 |
JP2008000848(A) |
申请公布日期 |
2008.01.10 |
申请号 |
JP20060172897 |
申请日期 |
2006.06.22 |
申请人 |
TOYO TIRE & RUBBER CO LTD |
发明人 |
KAZUNO ATSUSHI;SHIMOMURA TETSUO;NAKAI YOSHIYUKI;OGAWA KAZUYUKI;KIMURA TAKESHI |
分类号 |
B24B37/20;B24B37/24;B29C45/14;H01L21/304 |
主分类号 |
B24B37/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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