发明名称 POLISHING PAD AND ITS MANUFACTURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a polishing pad which improves flattening performance without lowering a polishing speed and wear resistance, a manufacturing method for the polishing pad and a manufacturing method for a semiconductor device using the polishing pad. <P>SOLUTION: The polishing pad has a polishing layer 2 formed of a polyurethane foaming body in the concave section of a concave highly-elastic layer 3 in a firmly-stuck state. The highly-elastic layer is formed of a non-foaming body, and the elastic modulus of the highly-elastic layer is greater than the elastic modulus of the polishing layer by 10 MPa or larger. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008000848(A) 申请公布日期 2008.01.10
申请号 JP20060172897 申请日期 2006.06.22
申请人 TOYO TIRE & RUBBER CO LTD 发明人 KAZUNO ATSUSHI;SHIMOMURA TETSUO;NAKAI YOSHIYUKI;OGAWA KAZUYUKI;KIMURA TAKESHI
分类号 B24B37/20;B24B37/24;B29C45/14;H01L21/304 主分类号 B24B37/20
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