发明名称 NEGATIVE RESISTANCE ELEMENT, ITS MANUFACTURING METHOD, SINGLE-ELECTRON TUNNEL ELEMENT, ITS MANUFACTURING METHOD, PHOTOSENSOR, ITS MANUFACTURING METHOD, FUNCTIONAL ELEMENT, AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a negative resistance element and its manufacturing method which is manufactured by a simple process at a low cost with a high substrate selectivity, operable at a higher temperature than room temperature, and strong against the noise. SOLUTION: A tunnel negative resistance element having a MOSFET structure is composed by forming a gate insulation film 12 on a substrate 11, forming thereon a multiple nanodot structure 13 composed of a plurality of nano-dots 13a which are made of an oxide semiconductor such as ZnO, etc. and mutually bonded through a double Schottky barrier 13b in one plane, and forming a source electrode 14 and a drain electrode 15 thereon. The nanodot 13a has a diameter of≤60 nm or≤20 nm. The tunnel negative resistance element is used for a single-electron transistor, a single-electron pump, a single-electron memory, etc. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008004791(A) 申请公布日期 2008.01.10
申请号 JP20060173394 申请日期 2006.06.23
申请人 SONY CORP 发明人 ITO DAISUKE
分类号 H01L29/66;H01L21/336;H01L27/10;H01L29/06;H01L29/786;H01L29/80 主分类号 H01L29/66
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