发明名称 METHOD OF EVALUATING PESSIMISTIC ERROR IN STATISTICAL STATIC TIMING ANALYSIS
摘要 First, a yield is calculated by employing conventional SSTA. Next, an independent LL set is determined, the independent LL set being a subset having sets of delay element sets that only include gates and nets not being shared by two or more paths. Next, a yield is calculated by employing SSTA while using only the independent LL set. Thereby, it is understood that the actual yield is between the yield obtained by employing the conventional SSTA and the yield obtained by employing the SSTA using only the independent LL set.
申请公布号 US2008010558(A1) 申请公布日期 2008.01.10
申请号 US20070679496 申请日期 2007.02.27
申请人 FUJITSU LIMITED 发明人 IKEDA HIROSHI
分类号 G06F11/30 主分类号 G06F11/30
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