| 摘要 |
<p>The method involves measuring potentials during on-line measurement and evaluating temporal sequence of measurements. The potentials are summed and Fourier transformed. The frequency spectrum variation in the sequence is evaluated and the total of the sum is averaged. An average value is evaluated and a transient effect of measurements resulting from parasitic load capacity is used to inspect an insulation measuring instrument during off-line measurement, where circuit-breakers (52a-52c, 54a-54c) designed as insulated gate bipolar transistor are closed during the off-line measurement.</p> |
