发明名称 Method and apparatus for controlling the magnetic field intensity in a plasma enhanced semiconductor wafer processing chamber
摘要 A magnetic field generator for producing a magnetic field that accelerates plasma formation is placed proximate a reaction chamber of semiconductor substrate processing system. The magnetic field generator has four main magnetic coil sections for producing a magnetic field nearly parallel to the top surface of a support pedestal in the reaction chamber and four sub-magnetic coil sections placed generally coaxially with the main magnetic coil sections to produce a magnetic field of the direction opposite of that of the magnetic field produced with the main magnetic coil sections. In the magnetic field generator, magnetic fields of opposite polarities are superimposed on each other when electric currents of opposite directions are applied to the main and sub-magnetic coil sections.
申请公布号 US7316199(B2) 申请公布日期 2008.01.08
申请号 US20020146443 申请日期 2002.05.14
申请人 APPLIED MATERIALS, INC. 发明人 HORIOKA KEIJI;YAN CHUN;SHIN TAEHO;LINDLEY ROGER ALAN;LI QI;HUGHES PANYIN;BURNS DOUGLAS H.;LEE EVANS Y.;PU BRYAN Y.
分类号 C23C16/00;H05H1/46;H01J37/32;H01L21/302;H01L21/306;H01L21/3065 主分类号 C23C16/00
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