| 摘要 |
An on die termination (ODT) test device includes: a control unit for selectively activating a plurality of pull-up signals and a plurality of pull-down signals by performing a logic operation to an ODT control signal for controlling a resistor of a termination terminal, an off chip driver (OCD) control signal for adjusting an impedance of an output terminal, a plurality of ODT test signals for measuring a termination resistance of the termination terminal and a plurality of ODT signals having a different resistance; and a pull-up/pull-down unit for selectively driving a plurality of pull-up drivers and a plurality of pull-down drivers according to the pull-up signals and the pull-down signals in order to output a corresponding resistance of the output terminal at a read operation mode.
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