| 摘要 |
A sense amplifier circuit with faster sensing speed and improved insensitivities to fabrication process variations (i.e., eliminated functional failures) is provided herein. According to one embodiment, the sense amplifier circuit associated with a row of memory cells within a memory device may include a charging portion, which is coupled for receiving a reference voltage that is supplied to at least one additional sense amplifier circuit within the memory device. The reference voltage is provided by a current reference generator, which is coupled to the sense amplifier circuit(s) for detecting: (i) a maximum amount of current that can pass through one compare stack within the memory cell array, or (ii) a difference between the maximum amount of current and the current contribution of an n-channel current source within the sense amplifier circuit. A memory device and method of operating one embodiment of the improved sense amplifier circuit are also provided herein.
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