发明名称 FLAT TRANSMITTANCE MODULATION(TM) BLANK MASK AND PHOTOMASK USING THE SAME
摘要 <p>A flat transmittance modulation(TM) blank mask and a photomask using the same are provided to improve productivity in a process by providing a semi-permeable membrane which is easy to examine in an examination wavelength. A flat transmittance modulation blank mask is formed by stacking any one of a light shielding film, a semi-permeable film, and an anti-reflection film on a transparent substrate and then coating photoresist on the stacked substrate. A difference in transmittance of the semi-permeable film in wavelengths of I-line(365 nm), h-line(405 nm), and g-line(436 nm) is 5 % or less. The transmittance in the wavelengths is in the range of 10 to 90 %. A thickness of the semi-permeable film in the wavelengths is in the range of 5 to 70 nm. The transmittance of a front side of the semi-permeable film is in the range of 5 to 70 % in any one wavelength of the wavelengths in the range of 300 to 600 nm. A difference between the transmittance of the front side of the semi-permeable film and the transmittance of a surface of the light shielding film or the anti-reflection film is in the range of 5 to 60% in any one wavelength of the wavelengths in the range of 300 to 600 nm.</p>
申请公布号 KR20080003206(A) 申请公布日期 2008.01.07
申请号 KR20070035555 申请日期 2007.04.11
申请人 S&STECH CO., LTD. 发明人 NAM, KEE SOO;RYU, GI HUN;KANG, HYOUNG JONG;CHA, HAN SUN
分类号 G03F1/00;H01L21/027 主分类号 G03F1/00
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