发明名称 |
THE FABRICATING METHOD OF SEMICONDUCTOR DEVICE |
摘要 |
<p>A method for manufacturing a semiconductor device is provided to process efficiently a large-sized wafer by suppressing a use of harmful hexamethyldisilazane. An EUV(extreme ultraviolet) light generation unit irradiates EUV ultraviolet light onto a surface of a wafer or an atmospheric plasma generation unit irradiates atmospheric plasma onto the surface of the wafer to hydrophobize the surface of the wafer. A cooling process is performed to cool the wafer. A photoresist film is coated on the cooled wafer. The EUV ultraviolet light generation unit is arranged at an upper part of the wafer. The EUV ultraviolet light generation unit is moved above the wafer to scan the entire area of the wafer.</p> |
申请公布号 |
KR100792344(B1) |
申请公布日期 |
2008.01.07 |
申请号 |
KR20060133252 |
申请日期 |
2006.12.23 |
申请人 |
DONGBU ELECTRONICS CO., LTD. |
发明人 |
PARK, JIN TAE |
分类号 |
H01L21/205;H01L21/027 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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