| 发明名称 |
METHODS AND APPARATUS FOR DATA ANALYSIS |
| 摘要 |
A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a fabrication process for components based on test data for the components.
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| 申请公布号 |
KR20080003456(A) |
申请公布日期 |
2008.01.07 |
| 申请号 |
KR20077028096 |
申请日期 |
2007.11.30 |
| 申请人 |
TEST ADVANTAGE, INC. |
发明人 |
BUXTON PAUL;MIGUELANEZ EMILIO;TABOR ERIC PAUL;ZALZALA ALI M. S. |
| 分类号 |
G06F19/00;G05B23/02;G06F |
主分类号 |
G06F19/00 |
| 代理机构 |
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