发明名称 NON-CONTACT TYPE APPARATUS FOR MEASURING THE HEIGHT OF NEEDLE OF PROBE CARD
摘要 A non-contact type apparatus for measuring a height of a needle of a probe card is provided to obtain reliable data by using a short wavelength laser. A probe card is loaded on a main card installation plate(120). A cover plate(160) is installed on the main card installation plate. The cover plate includes an opening for exposing a center of the main card installation plate. A card installation reference plate(150) has a ring-shaped structure. An outer circumference of the card installation reference plate is loaded on the cover plate. An inner circumference of the card installation reference plate is closely attached to a periphery of the probe card. A laser unit is installed in a top space of the card installation reference plate. A height calculation unit measures a gap between the laser unit and the card installation reference plate in order to obtain a planar equation of the card installation reference plate, detects a gap between an end of the needle and the laser unit, and decides the height of the needle.
申请公布号 KR100791113(B1) 申请公布日期 2008.01.04
申请号 KR20060133611 申请日期 2006.12.26
申请人 HNC INC. 发明人 MOON, JANG HYUK
分类号 H01L21/66;G01B11/02 主分类号 H01L21/66
代理机构 代理人
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