| 摘要 |
<p>An apparatus for marking and vision inspection of the semiconductor device, more particularly, to an apparatus for marking and vision inspection of the semiconductor device which marks company logo, etc. on a surface of a semiconductor device and performs an inspection of an external appearance of a semiconductor device, the apparatus which includes a marking unit for performing a marking process in which a mark is formed on a surface of a semiconductor device; one or more vision inspection units for performing a vision inspection process in which an external appearance of a semiconductor device is examined, the vision inspection unit being installed together with the marking unit; and a sorting unit for sorting and loading semiconductor devices in accordance with inspection result for the external appearance of the vision inspection unit, is disclosed.</p> |
