发明名称 Optical inspection system for measuring e.g. unpacked electronic components, has endoscope with optical inlet and optical outlet arranged such that electronic component that is found in coverage penetrates under diagonal angle
摘要 #CMT# #/CMT# The system (100) has a camera for detecting an electronic component (141) that is found in given spatial coverage, and a light guiding unit i.e. endoscope (120), with an optical inlet and an optical outlet, where the outlet is optically coupled with the camera and the inlet is introduced into the coverage. The endoscope has a rigid shape, and is arranged such that the component that is found in the coverage penetrates under a diagonal angle. The endoscope is adjustably supported relative to a chassis, and has an optical deflecting unit arranged at the inlet. #CMT#USE : #/CMT# Used for measuring unpacked electronic components, which are present in a given spatial coverage, in medical technology or with the inspection of a turbine. #CMT#ADVANTAGE : #/CMT# The utilization of the endoscope as a light guiding unit allows the realization of the inspection system in a simple and inexpensive manner. The optical inspection system can be developed within a smaller area and which allows a reliable measurement of the unpacked electronic components. #CMT#DESCRIPTION OF DRAWINGS : #/CMT# The drawing shows a schematic view of an optical inspection system. 100 : Optical inspection system 120 : Endoscope 141 : Electronic component 160 : Lighting unit 163 : Diffusing panel.
申请公布号 DE102006027663(A1) 申请公布日期 2008.01.03
申请号 DE20061027663 申请日期 2006.06.14
申请人 SIEMENS AG 发明人 GEBHARD, MATTHIAS;HIPPAUF, BARBARA;PANTEL, BORIS
分类号 H05K13/02 主分类号 H05K13/02
代理机构 代理人
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